Search results for: Jerke, John M.

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  1. 1

    Interlaboratory study on linewidth measurements for antireflective chromium photomasks

    Authors: Jerke, John M.
    Published: U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.p.O., 1982
    Physical Description: vii, 183 pages : illustrations ; 28 cm.
    Government Document Book
  2. 2

    Accurate linewidth measurements on integrated-circuit photomasks

    Authors: Jerke, John M.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1980
    Other Authors: “…Jerke, John M.…”
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook
  3. 3

    Interlaboratory study on linewidth measurements for antireflective chromium photomasks

    Authors: Jerke, John M.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982
    Other Authors:
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook