Search results for: Varner, Ruth N.

Showing 1 - 13 results of 13 Refine Results
  1. 1

    National Bureau of Standards mass calibration computer software

    Authors: Varner, Ruth N.
    Published: 1980
    Physical Description: v, 158 pages : illustrations ; 28 cm.
    Government Document Book
  2. 2

    Computer software for measurement assurance of gage blocks

    Authors: Varner, Ruth N.
    Published: U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1982
    Physical Description: iii, 54 pages ; 28 cm.
    Government Document Book
  3. 3

    FORTRAN program to determine length of gage blocks using single wavelength interferometry

    Authors: Varner, Ruth N.
    Published: Department of Commerce, National Bureau of Standards, Institute for Basic Standards, : for sale by the Supt. of Docs., U.S. Govt. Print. Off, 1977
    Physical Description: 2 unnumbered pages, 51 pages, 1 unnumbered page : diagrams, graphs ; 26 cm.
    Government Document Book
  4. 4

    National Bureau of Standards mass calibration computer software

    Authors: Varner, Ruth N.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1980
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook
  5. 5

    Measurement assurance for dimensional measurements on integrated-circuit photomasks

    Authors: Croarkin, Carroll
    Published: U.S. Department of Commerce, National Bureau of Standards : For sale by Supt. of Docs., U.S. G.P.O., 1982
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: v, 44 pages : illustrations ; 28 cm.
    Government Document Book
  6. 6

    Interlaboratory study on linewidth measurements for antireflective chromium photomasks

    Authors: Jerke, John M.
    Published: U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.p.O., 1982
    Other Authors:
    Physical Description: vii, 183 pages : illustrations ; 28 cm.
    Government Document Book
  7. 7

    Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems : standard reference materials

    Authors: Vezzetti, Carol F.
    Published: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: 1 volume.
    Government Document Microfilm Book
  8. 8

    Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems

    Authors: Vezzetti, Carol F.
    Published: U.S. Department of Commerce, National Institute of Standards and Technology, 1991
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: xii, 33 pages : illustrations ; 28 cm.
    Government Document Book
  9. 9

    Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

    Authors: Vezzetti, Carol F.
    Published: U.S. Department of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: xi, 37 pages : illustrations ; 28 cm.
    Government Document Microfilm Book
  10. 10

    Standard reference materials : antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

    Authors: Vezzetti, Carol F.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook
  11. 11

    Standard reference materials : antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

    Authors: Vezzetti, Carol F.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook
  12. 12

    Standard reference materials : bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems

    Authors: Vezzetti, Carol F.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991
    Other Authors: “…Varner, Ruth N.…”
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook
  13. 13

    Interlaboratory study on linewidth measurements for antireflective chromium photomasks

    Authors: Jerke, John M.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982
    Other Authors:
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook