Search results for: Varner, Ruth N.
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1
National Bureau of Standards mass calibration computer software
Authors: Varner, Ruth N.
Published: 1980Physical Description: v, 158 pages : illustrations ; 28 cm.Holdings: Loading…
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2
Computer software for measurement assurance of gage blocks
Authors: Varner, Ruth N.
Published: U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1982Physical Description: iii, 54 pages ; 28 cm.Holdings: Loading…
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3
FORTRAN program to determine length of gage blocks using single wavelength interferometry
Authors: Varner, Ruth N.
Published: Department of Commerce, National Bureau of Standards, Institute for Basic Standards, : for sale by the Supt. of Docs., U.S. Govt. Print. Off, 1977Physical Description: 2 unnumbered pages, 51 pages, 1 unnumbered page : diagrams, graphs ; 26 cm.Holdings: Loading…
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4
National Bureau of Standards mass calibration computer software
Authors: Varner, Ruth N.Other Authors: “…Varner, Ruth N.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1980
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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5
Measurement assurance for dimensional measurements on integrated-circuit photomasks
Authors: Croarkin, CarrollOther Authors: “…Varner, Ruth N.…”
Published: U.S. Department of Commerce, National Bureau of Standards : For sale by Supt. of Docs., U.S. G.P.O., 1982
Physical Description: v, 44 pages : illustrations ; 28 cm.Holdings: Loading…
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6
Interlaboratory study on linewidth measurements for antireflective chromium photomasks
Authors: Jerke, John M.Other Authors:
Published: U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.p.O., 1982Physical Description: vii, 183 pages : illustrations ; 28 cm.Holdings: Loading…
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7
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems : standard reference materials
Authors: Vezzetti, Carol F.Other Authors: “…Varner, Ruth N.…”
Published: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992
Physical Description: 1 volume.Holdings: Loading…
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8
Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems
Authors: Vezzetti, Carol F.Other Authors: “…Varner, Ruth N.…”
Published: U.S. Department of Commerce, National Institute of Standards and Technology, 1991
Physical Description: xii, 33 pages : illustrations ; 28 cm.Holdings: Loading…
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9
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Authors: Vezzetti, Carol F.Other Authors: “…Varner, Ruth N.…”
Published: U.S. Department of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1992
Physical Description: xi, 37 pages : illustrations ; 28 cm.Holdings: Loading…
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10
Standard reference materials : antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Authors: Vezzetti, Carol F.Other Authors: “…Varner, Ruth N.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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11
Standard reference materials : antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Authors: Vezzetti, Carol F.Other Authors: “…Varner, Ruth N.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
Government Document Electronic eBook -
12
Standard reference materials : bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems
Authors: Vezzetti, Carol F.Other Authors: “…Varner, Ruth N.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
Government Document Electronic eBook -
13
Interlaboratory study on linewidth measurements for antireflective chromium photomasks
Authors: Jerke, John M.Other Authors:
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
Government Document Electronic eBook