Characterization of crystal growth defects by X-ray methods : proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held Aug. 29-Sept. 10, 1979, at Durham University, Durham, United Kingdom / edited by Brian K. Tanner and D. Keith Bowen.
| Uniform Title: | NATO advanced study institutes series. Physics ;
Series B, v. 63. |
|---|---|
| Corporate Author: | |
| Other Authors: | |
| Language: | English |
| Published: |
New York, N.Y. :
Plenum Press,
[1980], ©1980.
|
| Series: | NATO advanced study institutes series. Physics ;
v. 63. |
| Subjects: | |
| Genre: | |
| Physical Description: | xxvi, 589 pages : illustrations ; 26 cm. |
| Format: | Conference Proceeding Book |
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