The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling / Marek-Jerzy Pindera, Jacob Aboudi, Steven M. Arnold.
| Uniform Title: | NASA technical memorandum ;
209770. |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Other Authors: | |
| Language: | English |
| Published: |
Cleveland, Ohio : Hanover, MD : Springfield, VA :
National Aeronautics and Space Administration, Glenn Research Center ; Available from NASA Center for Aerospace Information ; National Technical Information Service [distributor],
[1999]
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| Series: | NASA technical memorandum ;
209770. |
| Subjects: | |
| Physical Description: | 1 volume. |
| Format: | Government Document Microfilm Book |
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