Calibration service of optoelectronic frequency response at 1319 nm for combined photodiode/RF power sensor transfer standards / Paul D. Hale and C.M. Wang.
| Uniform Title: | NIST special publication. NIST measurement services.
NIST special publication ; 250-51. |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Other Authors: | |
| Language: | English |
| Published: |
Boulder, Colo. :
U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology,
[1999]
|
| Series: | NIST special publication. NIST measurement services.
NIST special publication ; 250-51. |
| Subjects: | |
| Physical Description: | iv, 47 pages : illustrations ; 28 cm. |
| Format: | Government Document Microfilm Book |
MARC
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| 100 | 1 | |a Hale, Paul D. | |
| 245 | 1 | 0 | |a Calibration service of optoelectronic frequency response at 1319 nm for combined photodiode/RF power sensor transfer standards / |c Paul D. Hale and C.M. Wang. |
| 260 | |a Boulder, Colo. : |b U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, |c [1999] | ||
| 300 | |a iv, 47 pages : |b illustrations ; |c 28 cm. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a microform |b h |2 rdamedia | ||
| 338 | |a microfiche |b he |2 rdacarrier | ||
| 490 | 1 | |a NIST special publication ; |v 250-51 | |
| 490 | 1 | |a NIST measurement services | |
| 500 | |a "December 1999." | ||
| 500 | |a Shipping list number: 2002-0120-M. | ||
| 500 | |a Paper version no longer for sale by the Supt. of Docs. | ||
| 500 | |a Microform. | ||
| 504 | |a Includes bibliographical references (pages 27-29). | ||
| 533 | |a Microfiche. |b [Washington, D.C.] : |c Supt. of Docs., U.S. G.P.O., |d 2002 |e 1 microfiche : negative. | ||
| 650 | 0 | |a Optical detectors |x Calibration |z United States. |0 http://id.loc.gov/authorities/subjects/sh85095144 | |
| 650 | 0 | |a Optoelectronic devices |x Calibration |z United States. |0 http://id.loc.gov/authorities/subjects/sh85095200 | |
| 650 | 0 | |a Scientific apparatus and instruments |x Calibration |z United States. |0 http://id.loc.gov/authorities/subjects/sh85118678 | |
| 700 | 1 | |a Wang, C. M. |0 http://id.loc.gov/authorities/names/n88672735 | |
| 710 | 2 | |a National Institute of Standards and Technology (U.S.) |0 http://id.loc.gov/authorities/names/n88112126 | |
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| 830 | 0 | |a NIST special publication ; |v 250-51. |0 http://id.loc.gov/authorities/names/n88507958 | |
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