A Model for Optimal Constrained Adaptive Testing / Wim J. van der Linden and Lynda M. Reese.
A model for constrained computerized adaptive testing is proposed in which the information in the test at the ability estimate is maximized subject to a large variety of possible constraints on the contents of the test. At each item-selection step, a full test is first assembled to have maximum info...
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Language: | English |
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[Place of publication not identified] :
Distributed by ERIC Clearinghouse,
1997.
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Physical Description: | 23 pages |
Format: | Microfilm Book |
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