Generation Status and Achievement in High School / Michael J. White and Jennifer E. Glick.

Data from the 1980 and 1982 High School and Beyond Surveys are used to compare the achievement of immigrant and native students in high school. The study examines effects of generation and duration of residence in the United States on improvement in students' performance on standardized tests over a...

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Bibliographic Details
Main Authors: White, Michael J.
Glick, Jennifer E. (Author)
Language:English
Published: [Place of publication not identified] : Distributed by ERIC Clearinghouse, 1998.
Subjects:
Genre:
Physical Description:41 pages
Format: Microfilm Book
Description
Summary:
Data from the 1980 and 1982 High School and Beyond Surveys are used to compare the achievement of immigrant and native students in high school. The study examines effects of generation and duration of residence in the United States on improvement in students' performance on standardized tests over a 2-year period beginning with the year the students were sophomores in high school. The results of the multivariate analyses suggest that even controlling for family background and ethnic group, recent immigrants have the lowest test scores (in 1980). However, when the trajectory of achievement is examined, as measured by increases in test scores between 1980 and 1982, generation status is no longer significant. Thus, the best predictors of achievement during the high school years are not those based on the nativity of the student, but rather those that reflect the social environment experienced in the United States, such as ethnicity, family socioeconomic status, and previous school performance. Recent immigrants, whether or not they are old for their grade, "catch up" with peers of similar age over the 2 years when other background characteristics are controlled. (Contains 5 tables, 4 figures, and 33 references.) (SLD)
Note:ERIC Note: Revised version of a paper presented at the Annual Meeting of the American Sociological Association (San Francisco, CA, August 21-25, 1998).
Microform.
Call Number:ED425207 Microfiche
Reproduction Note:
Microfiche. [Washington D.C.]: ERIC Clearinghouse microfiches : positive.