Search results for: IEEE Standards Coordinating Committee 20
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1
IEEE trial-use standard for artificial intelligence and expert system tie to automatic test equipment (AI-ESTATE) : overview and architecture
Published: Institute of Electrical and Electronics Engineers, 1996Physical Description: vi, 25 pages : illustrations ; 28 cmHoldings: Loading…
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2
IEEE trial-use standard for artificial intelligence exchange and service tie to all test environments (AI-ESTATE) : data and knowledge specification
Published: Institute of Electrical and Electronics Engineers, 1997Physical Description: vii, 103 pages : illustrations ; 28 cmHoldings: Loading…
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3
IEEE standard for test equipment description language (TEDL)
Published: Institute of Electrical and Electronics Engineers, 1997Physical Description: vii, 64 pages : illustrations ; 28 cmHoldings: Loading…
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4
IEEE ABBET : trial-use standard for common Ada packages for a broad-based environment for test (ABBET)
Published: Institute of Electrical and Electronics Engineers, 1993Physical Description: ix, 94 pages ; 23 cm.Holdings: Loading…
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5
IEEE ABBET : trial-use standard for a broad-based environment for test (ABBET) : overview and architecture
Published: Institute of Electrical and Electronics Engineers, 1993Physical Description: x, 51 pages : illustrations ; 23 cm.Holdings: Loading…
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6
IEEE standard for software interface for resource management for a broad-based environment for test (ABBET)
Published: Institute of Electrical and Electronics Engineers, 1998Physical Description: vi, 95 pages : illustrations ; 28 cmHoldings: Loading…
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7
IEEE trial-use standard for a broad-based environment for test (ABBET) : overview and architecture
Published: Institute of Electrical and Electronics Engineers, 1999Physical Description: vii, 50 pages : illustrations ; 28 cm.Holdings: Loading…
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8
IEEE guide to the use of ATLAS specification
Published: Institute of Electrical and Electronics Engineers, 1998Physical Description: vii, 284 pages : illustrations ; 28 cmHoldings: Loading…
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9
IEEE ABBET : trial-use standard for Ada-based ATLAS-level test prodedure interface for a broad-based environment for test (ABBET)
Published: Institute of Electrical and Electronics Engineers, 1994Physical Description: xiii, 412 pages : illustrations ; 28 cm + + 1 computer disc (3 1/2 in.)Holdings: Loading…
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10
IEEE standard for digital test interchange format (DTIF)
Published: Institute of Electrical and Electronics Engineers, 1999Physical Description: vi, 99 pages : illustrations ; 28 cmHoldings: Loading…
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11
IEEE guide for digital test interchange format (DTIF) application
Published: Institute of Electrical and Electronics Engineers, 2001Physical Description: v, 32 pages : illustrations ; 28 cmHoldings: Loading…
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12
Standard test language for all systems--common/abbreviated test language for all systems (C/ATLAS)
Published: Institute of Electrical and Electronics Engineers, 1995Physical Description: xiv, 592 pages : illustrations ; 28 cmHoldings: Loading…
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13
IEEE standard for artificial intelligence exchange and service tie to all test environments (AI-ESTATE)
Published: Institute of Electrical and Electronics Engineers, 2002Physical Description: v, 113 pages : illustrations ; 28 cm, Also available via the World Wide Web with additional title: IEEE Std 1232-2002.Holdings: Loading…
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14
IEEE standard VHDL language reference manual
Published: The Institute of Electrical and Electronics Engineers, 1988Physical Description: 203 pages in various pagings ; 28 cm.Holdings: Loading…
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15
IEEE standard VHDL language reference manual
Published: Institute of Electrical and Electronics Engineers, 2000Physical Description: ix, 290 pages ; 28 cmHoldings: Loading…
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Related Subjects
Standards
ATLAS (Computer program language)
Testing
Artificial intelligence
Automatic test equipment
Data processing
Expert systems (Computer science)
Digital electronics
Electronic apparatus and appliances
VHDL (Computer hardware description language)
Ada (Computer program language)
Computer hardware description languages
Computer programs
Engineering