Search results for: IEEE Standards Coordinating Committee 20

Showing 1 - 15 results of 15 Refine Results
  1. 1

    IEEE trial-use standard for artificial intelligence and expert system tie to automatic test equipment (AI-ESTATE) : overview and architecture

    Published: Institute of Electrical and Electronics Engineers, 1996
    Physical Description: vi, 25 pages : illustrations ; 28 cm
    Book
  2. 2

    IEEE trial-use standard for artificial intelligence exchange and service tie to all test environments (AI-ESTATE) : data and knowledge specification

    Published: Institute of Electrical and Electronics Engineers, 1997
    Physical Description: vii, 103 pages : illustrations ; 28 cm
    Book
  3. 3

    IEEE standard for test equipment description language (TEDL)

    Published: Institute of Electrical and Electronics Engineers, 1997
    Physical Description: vii, 64 pages : illustrations ; 28 cm
    Book
  4. 4

    IEEE ABBET : trial-use standard for common Ada packages for a broad-based environment for test (ABBET)

    Published: Institute of Electrical and Electronics Engineers, 1993
    Physical Description: ix, 94 pages ; 23 cm.
    Book
  5. 5

    IEEE ABBET : trial-use standard for a broad-based environment for test (ABBET) : overview and architecture

    Published: Institute of Electrical and Electronics Engineers, 1993
    Physical Description: x, 51 pages : illustrations ; 23 cm.
    Book
  6. 6

    IEEE standard for software interface for resource management for a broad-based environment for test (ABBET)

    Published: Institute of Electrical and Electronics Engineers, 1998
    Physical Description: vi, 95 pages : illustrations ; 28 cm
    Book
  7. 7

    IEEE trial-use standard for a broad-based environment for test (ABBET) : overview and architecture

    Published: Institute of Electrical and Electronics Engineers, 1999
    Physical Description: vii, 50 pages : illustrations ; 28 cm.
    Book
  8. 8

    IEEE guide to the use of ATLAS specification

    Published: Institute of Electrical and Electronics Engineers, 1998
    Physical Description: vii, 284 pages : illustrations ; 28 cm
    Book
  9. 9

    IEEE ABBET : trial-use standard for Ada-based ATLAS-level test prodedure interface for a broad-based environment for test (ABBET)

    Published: Institute of Electrical and Electronics Engineers, 1994
    Physical Description: xiii, 412 pages : illustrations ; 28 cm + + 1 computer disc (3 1/2 in.)
    Book
  10. 10

    IEEE standard for digital test interchange format (DTIF)

    Published: Institute of Electrical and Electronics Engineers, 1999
    Physical Description: vi, 99 pages : illustrations ; 28 cm
    Book
  11. 11

    IEEE guide for digital test interchange format (DTIF) application

    Published: Institute of Electrical and Electronics Engineers, 2001
    Physical Description: v, 32 pages : illustrations ; 28 cm
    Book
  12. 12

    Standard test language for all systems--common/abbreviated test language for all systems (C/ATLAS)

    Published: Institute of Electrical and Electronics Engineers, 1995
    Physical Description: xiv, 592 pages : illustrations ; 28 cm
    Book
  13. 13

    IEEE standard for artificial intelligence exchange and service tie to all test environments (AI-ESTATE)

    Published: Institute of Electrical and Electronics Engineers, 2002
    Physical Description: v, 113 pages : illustrations ; 28 cm, Also available via the World Wide Web with additional title: IEEE Std 1232-2002.
    Electronic Book
  14. 14

    IEEE standard VHDL language reference manual

    Published: The Institute of Electrical and Electronics Engineers, 1988
    Physical Description: 203 pages in various pagings ; 28 cm.
    Book
  15. 15

    IEEE standard VHDL language reference manual

    Published: Institute of Electrical and Electronics Engineers, 2000
    Physical Description: ix, 290 pages ; 28 cm
    Book