Search results for: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics Albany, N.Y.
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Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...
Published: American Institute of Physics, 2009Physical Description: xii, 398 pages : illustrations ; 28 cm., Also issued on CD-ROM.Holdings: Loading…
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Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...
Published: American Institute of Physics, 2009Physical Description: 1 CD-ROM ; 4 3/4 in.Holdings: Loading…
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