Search results for: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics Albany, N.Y.

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  1. 1

    Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...

    Published: American Institute of Physics, 2009
    Physical Description: xii, 398 pages : illustrations ; 28 cm., Also issued on CD-ROM.
    Conference Proceeding Book
  2. 2

    Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...

    Published: American Institute of Physics, 2009
    Physical Description: 1 CD-ROM ; 4 3/4 in.
    Conference Proceeding Software Book