Search results for: Joy, David C.

Showing 1 - 10 results of 10 Refine Results
  1. 1

    Helium Ion Microscopy Principles and Applications

    Authors: Joy, David C.
    Published: Springer New York : Imprint: Springer, 2013
    Springer English/International eBooks 2013 - Full Set: 2013 (Springer Link)
    Electronic eBook
  2. 2

    Monte Carlo modeling for electron microscopy and microanalysis

    Authors: Joy, David C., 1943-
    Published: Oxford University Press, 1995
    ProQuest Ebook Central - Academic Complete: 1995 (Ebook Central @ Proquest)
    EBSCO eBooks: 1995 (EBSCO)
    eBook Academic Collection (EBSCOhost) – North America: 1995 (EBSCO)
    Electronic eBook
  3. 3

    Scanning Electron Microscopy and X-Ray Microanalysis

    Authors: Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M, Scott, John Henry J., Joy, David C.
    Published: Springer New York : Imprint: Springer, 2018
    Springer Chemistry and Materials Science eBooks 2018 English/International: 2018 (Springer Link)
    Electronic eBook
  4. 4

    EXAFS spectroscopy, techniques and applications

    Published: Plenum Press, 1981
    Other Authors:
    Physical Description: viii, 275 pages : illustrations ; 26 cm
    Book
  5. 5

    An introduction to tropical agricultural science

    Authors: Aiyegbayo, J. T.
    Published: Evans Brothers, 1980
    Other Authors: “…Joy, David C., 1943-…”
    Physical Description: 107 pages : illustrations ; 25 cm
    Book
  6. 6

    Introduction to electron holography

    Authors: Völkl, Edgar
    Published: Kluwer Academic/Plenum Publishers, 1999
    Other Authors:
    Springer Book Archive - Chemistry & Material Science: 1999 (Springer Link)
    Electronic eBook
  7. 7

    Principles of analytical electron microscopy

    Published: Plenum Press, 1986
    Other Authors: “…Joy, David C., 1943-…”
    Springer Book Archive - Biomedicine & Life Sciences: 1986 (Springer Link)
    Electronic eBook
  8. 8

    Introduction to analytical electron microscopy

    Published: Plenum Press, 1979
    Other Authors:
    Physical Description: xv, 601 pages : illustrations ; 27 cm
    Book
  9. 9

    Principles of analytical electron microscopy

    Published: Plenum Press, 1986
    Other Authors: “…Joy, David C., 1943-…”
    Physical Description: xvi, 448 pages : illustrations ; 26 cm
    Book
  10. 10

    SEM microcharacterization of semiconductors

    Published: Academic Press, 1989
    Other Authors:
    Physical Description: xiii, 452 pages : illustrations ; 24 cm.
    Book