Search results for: Larrabee, R. D.
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Measurement techniques for high-resistivity detector-grade silicon : progress report, July 1, 1982 to June 30, 1983
Authors: Larrabee, R. D.
Published: The Laboratory ; [Order from National Technical Information Service], 1983Physical Description: iv, 16 pages : illustrations ; 28 cm.Holdings: Loading…
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2
Theory and application of a two-layer hall technique
Authors: Larrabee, R. D.Other Authors: “…Larrabee, R. D.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1978
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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3
Measurement techniques for high-resistivity detector-grade silicon : progress report, July 1, 1982 to June 30, 1983
Authors: Larrabee, R. D.Other Authors: “…Larrabee, R. D.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1983
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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4
Nondestructive evaluation activities in the Semiconductor Materials and Processes Division
Authors: Larrabee, R. D.Other Authors:
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1986Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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5
A FORTRAN program for calculating the electrical parameters of extrinsic silicon
Authors: Larrabee, R. D.Other Authors:
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1980Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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6
Measurement techniques for high power semiconductor materials and devices : annual report, October, 1, 1980 to December 31, 1981
Authors: Thurber, W. RobertOther Authors:
Published: U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1982Physical Description: v, 60 pages : illustrations ; 28 cm.Holdings: Loading…
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7
Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1978 to September 30, 1979
Authors: Oettinger, F. F.Other Authors: “…Larrabee, R. D.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1980
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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8
Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1980 to December 31, 1981
Authors: Thurber, W. RobertOther Authors: “…Larrabee, R. D.…”
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982
Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
Government Document Electronic eBook