Search results for: Ritchie, Nicholas W.M

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   Scanning Electron Microscopy and X-Ray Microanalysis

   Authors: Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M, Scott, John Henry J., Joy, David C.
   Published: Springer New York : Imprint: Springer, 2018

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   Springer Chemistry and Materials Science eBooks 2018 English/International: 2018 (Springer Link)
   

   Electronic eBook