Search results for: Seiler, David G.

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  1. 1

    Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

    Authors: Seiler, David G.
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1994
    Other Authors:
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook
  2. 2

    Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

    Published: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994
    Other Authors: “…Seiler, David G.…”
    Physical Description: 1 volume (various pagings) : illustrations.
    Government Document Microfilm Book
  3. 3

    Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland, March 1998

    Published: American Institute of Physics, 1998
    Other Authors: “…Seiler, David G.…”
    Physical Description: xv, 960 pages : illustrations ; 28 cm + 1 computer disc.
    Conference Proceeding Software Book
  4. 4

    Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000

    Published: American Institute of Physics, 2001
    Other Authors: “…Seiler, David G.…”
    Physical Description: xv, 708 pages : illustrations ; 28 cm + 1 computer disc (4 3/4 in).
    Conference Proceeding Book
  5. 5

    Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003

    Published: American Institute of Physics, 2003
    Other Authors: “…Seiler, David G.…”
    Physical Description: xviii, 818 pages : illustrations ; 28 cm.
    Conference Proceeding Book
  6. 6

    Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003

    Published: American Institute of Physics, 2003
    Other Authors: “…Seiler, David G.…”
    Physical Description: 1 CD-ROM : color ; 4 3/4 in., PDF version of the print proceedings, plus search software and Adobe Acrobat reader.
    Conference Proceeding Software eBook
  7. 7

    Characterization and metrology for ULSI technology

    Published: American Institute of Physics, 2005
    Other Authors: “…Seiler, David G.…”
    Physical Description: xx, 667 pages : illustrations ; 28 cm., Also issued on CD-ROM and online.
    Conference Proceeding Book
  8. 8

    Characterization and metrology for ULSI technology

    Published: American Institute of Physics, 2005
    Other Authors: “…Seiler, David G.…”
    Physical Description: 1 CD-ROM : PDF, color ; 4 3/4 in., Also issued in print.
    Conference Proceeding Software eBook
  9. 9

    Characterization and metrology for ULSI technology 2005, Richardson, Texas, 15-18 March 2005

    Published: American Institute of Physics, 2005
    Other Authors: “…Seiler, David G.…”
    Physical Description: 1 electronic text : HTML, PDF, illustrations (some color)., Also issued in print.
    Connect to online resource - Authorized users
    Electronic Conference Proceeding eBook
  10. 10

    Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...

    Published: American Institute of Physics, 2009
    Other Authors: “…Seiler, David G.…”
    Physical Description: xii, 398 pages : illustrations ; 28 cm., Also issued on CD-ROM.
    Conference Proceeding Book
  11. 11

    Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...

    Published: American Institute of Physics, 2009
    Other Authors: “…Seiler, David G.…”
    Physical Description: 1 CD-ROM ; 4 3/4 in.
    Conference Proceeding Software Book
  12. 12

    Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

    Authors: Bullis, W. Murray, 1930-
    Published: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1995
    Other Authors:
    Physical Description: iv, 51 pages : illustrations ; 28 cm.
    Government Document Microfilm Book
  13. 13

    Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

    Authors: Bullis, W. Murray, 1930-
    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1995
    Other Authors:
    Physical Description: 1 online resource.
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook
  14. 14

    Metrology and diagnostic techniques for nanoelectronics

    Published: Pan Stanford Publishing, 2016
    Other Authors:
    Physical Description: xii, 1,411 pages : illustrations ; 24 cm
    Book
  15. 15

    Standard Reference Materials(R) User's Guide for RM 8096 and 8097 : The MEMS 5-in-1, 2013 Edition

    Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013
    Other Authors:
    Physical Description: 1 online resource (224 pages) : illustrations (color).
    Connect to online resource - All users (Federal Depository Library Program Persistant URL)
    Government Document Electronic eBook