Search results for: Seiler, David G.
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1
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
Authors: Seiler, David G.Other Authors:
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1994Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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2
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
Published: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994Other Authors: “…Seiler, David G.…”
Physical Description: 1 volume (various pagings) : illustrations.Holdings: Loading…
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3
Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland, March 1998
Published: American Institute of Physics, 1998Other Authors: “…Seiler, David G.…”
Physical Description: xv, 960 pages : illustrations ; 28 cm + 1 computer disc.Holdings: Loading…
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4
Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000
Published: American Institute of Physics, 2001Other Authors: “…Seiler, David G.…”
Physical Description: xv, 708 pages : illustrations ; 28 cm + 1 computer disc (4 3/4 in).Holdings: Loading…
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5
Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003
Published: American Institute of Physics, 2003Other Authors: “…Seiler, David G.…”
Physical Description: xviii, 818 pages : illustrations ; 28 cm.Holdings: Loading…
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6
Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003
Published: American Institute of Physics, 2003Other Authors: “…Seiler, David G.…”
Physical Description: 1 CD-ROM : color ; 4 3/4 in., PDF version of the print proceedings, plus search software and Adobe Acrobat reader.Holdings: Loading…
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7
Characterization and metrology for ULSI technology
Published: American Institute of Physics, 2005Other Authors: “…Seiler, David G.…”
Physical Description: xx, 667 pages : illustrations ; 28 cm., Also issued on CD-ROM and online.Holdings: Loading…
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8
Characterization and metrology for ULSI technology
Published: American Institute of Physics, 2005Other Authors: “…Seiler, David G.…”
Physical Description: 1 CD-ROM : PDF, color ; 4 3/4 in., Also issued in print.Holdings: Loading…
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9
Characterization and metrology for ULSI technology 2005, Richardson, Texas, 15-18 March 2005
Published: American Institute of Physics, 2005Other Authors: “…Seiler, David G.…”
Physical Description: 1 electronic text : HTML, PDF, illustrations (some color)., Also issued in print.Holdings: Loading…Connect to online resource - Authorized users
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10
Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...
Published: American Institute of Physics, 2009Other Authors: “…Seiler, David G.…”
Physical Description: xii, 398 pages : illustrations ; 28 cm., Also issued on CD-ROM.Holdings: Loading…
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11
Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New Yor...
Published: American Institute of Physics, 2009Other Authors: “…Seiler, David G.…”
Physical Description: 1 CD-ROM ; 4 3/4 in.Holdings: Loading…
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12
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
Authors: Bullis, W. Murray, 1930-Other Authors:
Published: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1995Physical Description: iv, 51 pages : illustrations ; 28 cm.Holdings: Loading…
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13
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
Authors: Bullis, W. Murray, 1930-Other Authors:
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1995Physical Description: 1 online resource.Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
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14
Metrology and diagnostic techniques for nanoelectronics
Published: Pan Stanford Publishing, 2016Other Authors:Physical Description: xii, 1,411 pages : illustrations ; 24 cmHoldings: Loading…
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15
Standard Reference Materials(R) User's Guide for RM 8096 and 8097 : The MEMS 5-in-1, 2013 Edition
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2013Other Authors:Physical Description: 1 online resource (224 pages) : illustrations (color).Holdings: Loading…Connect to online resource - All users (Federal Depository Library Program Persistant URL)
Government Document Electronic eBook