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00000cam a2200000 a 4500 |
| 001 |
in00000298953 |
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OCoLC |
| 005 |
20220616042543.0 |
| 008 |
860103s1984 nyua b 000 0 eng d |
| 035 |
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|a (OCoLC)12966861
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| 040 |
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|a EEM
|c EEM
|d UtOrBLW
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| 049 |
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|a EEME [c.1]
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| 090 |
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|a QC482.S6 I32 1984
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| 245 |
0 |
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|a IEEE standard test procedures for semiconductor x-ray energy spectrometers /
|c sponsor, Nuclear Instruments and Detectors Committee of the IEEE Nuclear and Plasma Sciences Society.
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| 260 |
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|a New York, N.Y. :
|b Institute of Electrical and Electronics Engineers,
|c 1984.
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| 300 |
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|a 39 pages :
|b illustrations ;
|c 28 cm
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
|
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|a unmediated
|b n
|2 rdamedia
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| 338 |
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|a volume
|b nc
|2 rdacarrier
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| 500 |
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|a "ANSI/IEEE std 759-1984"
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| 500 |
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|a At head of title: An American National Standard.
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| 500 |
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|a Approved Dec. 17, 1981, IEEE Standards Board; approved June 14, 1982, American National Standards Institute.
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| 504 |
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|a Bibliography: page 39.
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| 650 |
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|a X-ray spectroscopy.
|0 http://id.loc.gov/authorities/subjects/sh85148744
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| 650 |
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|a Spectrometer
|x Testing
|x Standards.
|0 http://id.loc.gov/authorities/subjects/sh85126414
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| 710 |
2 |
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|a IEEE Nuclear and Plasma Sciences Society.
|b Nuclear Instruments and Detectors Committee.
|0 http://id.loc.gov/authorities/names/n86817422
|
| 710 |
2 |
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|a Institute of Electrical and Electronics Engineers.
|0 http://id.loc.gov/authorities/names/n79053217
|
| 710 |
2 |
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|a American National Standards Institute.
|0 http://id.loc.gov/authorities/names/n79053041
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| 907 |
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|y .b12079601
|b 180726
|c 980608
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| 998 |
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|a rs
|b 980604
|c m
|d a
|e -
|f eng
|g nyu
|h 0
|i 3
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| 935 |
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|a AAX7723
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| 999 |
f |
f |
|i 27bbc6a3-bdca-5801-a3cb-44d2abb117e3
|s cad73c50-0575-5afd-9bb1-214d15be4674
|t 0
|
| 952 |
f |
f |
|p Can Circulate
|a Michigan State University-Library of Michigan
|b Michigan State University
|c MSU Remote Storage
|d MSU Remote Storage
|t 0
|e QC482.S6 I32 1984
|h Library of Congress classification
|i Printed Material
|m 31293004985275
|n 1
|
