Determining nanoscale physical properties of materials by microscopy and spectroscopy : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A. / editors, Mehmet Sarikaya, H. Kumar Wickramasinghe, Michael Isaacson.

Bibliographic Details
Uniform Title:	Materials Research Society symposia proceedings ; v. 332.
Other Authors:	Sarikaya, Mehmet Wickramasinghe, H. Kumar Isaacson, Michael (Michael Saul)
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1994], ©1994.
Series:	Materials Research Society symposia proceedings ; v. 332.
Subjects:	Nanostructures > Analysis > Congresses. Microscopy > Technique > Congresses. Spectrum analysis > Congresses.
Genre:	Congresses.
Physical Description:	xiv, 622 pages : illustrations ; 24 cm.
Format:	Book

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