Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites / David G. Seiler [and others].
| Uniform Title: | Semiconductor measurement technology.
NIST special publication ; 400-94. |
|---|---|
| Corporate Author: | |
| Other Authors: | |
| Language: | English |
| Published: |
Gaithersburg, MD : Washington, DC :
U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1994.
|
| Series: | Semiconductor measurement technology.
NIST special publication ; 400-94. |
| Subjects: | |
| Physical Description: | 1 volume (various pagings) : illustrations. |
| Format: | Government Document Microfilm Book |
MARC
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| 245 | 0 | 0 | |a Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites / |c David G. Seiler [and others]. |
| 260 | |a Gaithersburg, MD : |b U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; |a Washington, DC : |b For sale by the Supt. of Docs., U.S. G.P.O., |c 1994. | ||
| 300 | |a 1 volume (various pagings) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a microform |b h |2 rdamedia | ||
| 338 | |a microfiche |b he |2 rdacarrier | ||
| 490 | 1 | |a Semiconductor measurement technology | |
| 490 | 1 | |a NIST special publication ; |v 400-94 | |
| 500 | |a Distributed to depository libraries in microfiche. | ||
| 500 | |a Shipping list number: 94-0562-M. | ||
| 500 | |a "April 1994." | ||
| 500 | |a Microform. | ||
| 504 | |a Includes bibliographical references. | ||
| 533 | |a Microfiche. |b [Washington, D.C.?] : |c Supt. of Docs., U.S. G.P.O., |d [1994] |e 3 microfiches : negative. | ||
| 650 | 0 | |a Infrared detectors |z United States. |0 http://id.loc.gov/authorities/subjects/sh85066314 | |
| 650 | 0 | |a Meteorological satellites |z United States. |0 http://id.loc.gov/authorities/subjects/sh85084328 | |
| 650 | 0 | |a Geostationary satellites. |0 http://id.loc.gov/authorities/subjects/sh85054259 | |
| 650 | 0 | |a TIROS satellites. |0 http://id.loc.gov/authorities/subjects/sh85135576 | |
| 700 | 1 | |a Seiler, David G. |0 http://id.loc.gov/authorities/names/n85214620 | |
| 710 | 2 | |a National Institute of Standards and Technology (U.S.) |0 http://id.loc.gov/authorities/names/n88112126 | |
| 830 | 0 | |a Semiconductor measurement technology. |0 http://id.loc.gov/authorities/names/n42022064 | |
| 830 | 0 | |a NIST special publication ; |v 400-94. |0 http://id.loc.gov/authorities/names/n88507958 | |
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