Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites / David G. Seiler [and others].
| Uniform Title: | Semiconductor measurement technology.
NIST special publication ; 400-94. |
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| Other Authors: | |
| Language: | English |
| Published: |
Gaithersburg, MD : Washington, DC :
U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O.,
1994.
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| Series: | Semiconductor measurement technology.
NIST special publication ; 400-94. |
| Subjects: | |
| Physical Description: | 1 volume (various pagings) : illustrations. |
| Format: | Government Document Microfilm Book |