Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites / David G. Seiler [and others].

Bibliographic Details
Uniform Title:	Semiconductor measurement technology. NIST special publication ; 400-94.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Seiler, David G.
Language:	English
Published:	Gaithersburg, MD : Washington, DC : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Series:	Semiconductor measurement technology. NIST special publication ; 400-94.
Subjects:	Infrared detectors > United States. Meteorological satellites > United States. Geostationary satellites. TIROS satellites.
Physical Description:	1 volume (various pagings) : illustrations.
Format:	Government Document Microfilm Book

Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

Authors: Seiler, David G.
Published: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1994

Physical Description: 1 online resource.

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