Fundamentals of modern VLSI devices / Yuan Taur, Tak H. Ning.

Bibliographic Details
Main Author:	Taur, Yuan, 1946-
Other Authors:	Ning, Tak H., 1943-
Language:	English
Published:	Cambrige, UK ; New York : Cambridge University Press, 1998.
Subjects:	Metal oxide semiconductors, Complementary. Bipolar transistors. Integrated circuits > Very large scale integration.
Physical Description:	xxii, 469 pages : illustrations ; 26 cm
Format:	Book

Fundamentals of modern VLSI devices

Authors: Taur, Yuan, 1946-, Ning, Tak H., 1943-
Published: Cambridge University Press, 2022

Cambridge HE website textbooks complete collection: 2021 (Digital Object Identifier Permalink)

Electronic eBook

Authors: Taur, Yuan, 1946-
Published: Cambridge University Press, 2009

Physical Description: xxiii, 656 pages : illustrations ; 26 cm

Connect to: Table of contents only - All users (Cataloging @ Library of Congress)

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