Measuring the performance and intelligence of systems : proceedings of the 2000 PerMIS Workshop, August 14-16, 2000 / edited by A.M. Meystel, E.R. Messina ; co-sponsored by: National Institute of Standards and Technology [and others].

Bibliographic Details
Uniform Title:NIST special publication ; 970.
Corporate Authors: PerMIS Workshop National Institute of Standards and Technology
National Institute of Standards and Technology (U.S.)
Other Authors: Meystel, A. (Alex)
Messina, E. R. (Elena R.)
Language:English
Published: Gaithersburg, Md. : Washington, DC : The Institute ; For sale by the Supt. of Docs., U.S. G.P.O., [2001]
Series:NIST special publication ; 970.
Subjects:
Genre:
Physical Description:xi, 658 pages : illustrations ; 28 cm.
Format: Government Document Conference Proceeding Microfilm Book

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