Measuring the performance and intelligence of systems : proceedings of the 2000 PerMIS Workshop, August 14-16, 2000 / edited by A.M. Meystel, E.R. Messina ; co-sponsored by: National Institute of Standards and Technology [and others].
| Uniform Title: | NIST special publication ;
970. |
|---|---|
| Corporate Authors: | |
| Other Authors: | |
| Language: | English |
| Published: |
Gaithersburg, Md. : Washington, DC :
The Institute ; For sale by the Supt. of Docs., U.S. G.P.O.,
[2001]
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| Series: | NIST special publication ;
970. |
| Subjects: | |
| Genre: | |
| Physical Description: | xi, 658 pages : illustrations ; 28 cm. |
| Format: | Government Document Conference Proceeding Microfilm Book |