Distributed testing of a device-level interface specification for a metrology system / John Horst [and others].

Bibliographic Details
Uniform Title:NISTIR ; 6851.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Horst, John Albert
Language:English
Published: Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
Series:NISTIR ; 6851.
Subjects:
Computer software > Testing.
Coordinate measuring machines.
Metrology.
Physical Description:19 pages : illustrations ; 28 cm.
Format: Government Document Microfilm Book

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