Measuring the performance and intelligence of systems : proceedings of the 2002 PerMIS Workshop, August 13-15, 2002 / edited by E.R. Messina, A.M. Meystel.

Bibliographic Details
Uniform Title:NIST special publication ; 990.
Corporate Authors: PerMIS Workshop Gaithersburg, Md.
National Institute of Standards and Technology (U.S.)
Other Authors: Messina, E. R. (Elena R.)
Meystel, A. (Alex)
Language:English
Published: Gaithersburg, Md. : Washington, D.C. : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., [2002]
Series:NIST special publication ; 990.
Subjects:
Genre:
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Physical Description:ix, 467 pages : illustrations ; 28 cm.
Also available via Internet from the NIST web site. Address as of 8/20/03: http://www.isd.mel.nist.gov/research%5Fareas/research%5Fengineering/Performance%5FMetrics/PerMIS%5F2002%5FProceedings/index.htm; current access is available via PURL.
Format: Government Document Conference Proceeding Microfilm Book

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