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OCoLC |
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|b .I5 std.N42.31 2003
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|a QC795.42
|b .A477 2003
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|a American National Standard for measurement procedures for resolution and efficiency of wide-bandgap semiconductor detectors of ionizing radiation /
|c sponsor National Committee on Radiation Instrumentation, N42.
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260 |
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|a New York, NY :
|b Institute of Electrical and Electronics Engineers,
|c [2003], ©2003.
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300 |
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|a vii, 33 pages :
|b illustrations ;
|c 28 cm
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
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|a "ANSI N42.31-2003."
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|a "Acredited by the American National Standards Institute."
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|a "Secretariat the Institute of Electrical and Electronics Engineers."
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|a "Approved 20 February 2003, American National Standards Institute."
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|a "IEEE standards"--Cover.
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583 |
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|3 copy1
|a Committed to retain
|c 20200101
|d 20341231
|f MI-SPI
|u http://www.mcls.org/engagement/mi-spi/
|5 MiEM
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|a Ionizing radiation
|x Measurement
|x Standards.
|0 http://id.loc.gov/authorities/subjects/sh87003148
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650 |
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|a Semiconductor nuclear counters
|x Standards.
|0 http://id.loc.gov/authorities/subjects/sh85119898
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|a Semiconductors
|x Effect of radiation on
|x Measurement
|x Standards.
|0 http://id.loc.gov/authorities/subjects/sh85119909
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|a American National Standards Institute.
|b National Committee on Radiation Instrumentation, N42.
|0 http://id.loc.gov/authorities/names/n88612442
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|a Institute of Electrical and Electronics Engineers.
|0 http://id.loc.gov/authorities/names/n79053217
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|a American National Standards Institute.
|0 http://id.loc.gov/authorities/names/n79053041
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|p Can Circulate
|a Michigan State University-Library of Michigan
|b Michigan State University
|c MSU Remote Storage
|d MSU Remote Storage
|t 0
|e QC795.42 .A477 2003
|h Library of Congress classification
|i Printed Material
|m 31293022651693
|n 1
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