Measurement techniques for high-power semiconductor materials and devices : annual report, January, 1, 1982 to March 31, 1983 / W.R. Thurber, J.R. Lowney and W.E. Phillips.
| Uniform Title: | NBSIR ;
84-2838. |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Other Authors: | |
| Language: | English |
| Published: |
Washington, D.C. :
U.S. Department of Commerce, National Bureau of Standards, National Engineering Laboratory,
1984.
|
| Series: | NBSIR ;
84-2838. |
| Subjects: | |
| Physical Description: | iv, 46 pages : illustrations ; 28 cm. |
| Format: | Government Document Microfilm Book |
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance:
Please contact Reference and Discovery Services via their Contact Form or call them directly at: 517-353-8700 for assistance.