Optical imaging and metrology [electronic resource] : advanced technologies / edited by Wolfgang Osten, Nadya Reingand.
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics --
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Language: | English |
Published: |
Weinheim :
Wiley-VCH,
c2012.
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Online Access: | |
Variant Title: |
Optical Imaging and Metrology: Advanced Technologies |
Format: | Electronic eBook |
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